کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5007686 | 1461693 | 2018 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Measurement of small wavelength shift using diffraction grating and high-angular-sensitivity total-internal-reflection heterodyne interferometer
ترجمه فارسی عنوان
اندازه گیری طول موج کوتاه کوچک با استفاده از گریت پراش و حساسیت بالایی در برابر تداخل سنج هتودین
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
چکیده انگلیسی
This study presents a method for detecting small wavelength shifts using grating diffraction effect and high-angular-sensitivity total-internal-reflection (TIR) heterodyne interferometry. In the proposed interferometer, a half-wave plate and a quarter-wave plate that exhibit specific optic-axis azimuths are combined to form a phase shifter. When an isosceles right-angle prism is placed between the phase shifter and an analyzer that exhibits suitable transmission-axis azimuth, it shifts and enhances the phase difference of the s- and p- polarization states of the first-order diffraction beam at one TIR. The enhanced phase difference depends on the diffraction angle, which is a function of the beam wavelength; thus the wavelength shift can be easily and accurately measured by estimating the phase-difference variation. The feasibility of our method was demonstrated with a measurement resolution of approximately 0.007â¯nm and a sensitivity of 4.3°/nm in a measurement range of 5â¯nm. This method has the merits of both common-path interferometry and heterodyne interferometry.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 100, January 2018, Pages 155-160
Journal: Optics and Lasers in Engineering - Volume 100, January 2018, Pages 155-160
نویسندگان
Jiun-You Lin, Jing-Hsiang Jhuang, Meng-Chang Hsieh, Chia-Ou Chang,