کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | ترجمه فارسی | نسخه تمام متن |
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5014617 | 1369401 | 2016 | 8 صفحه PDF | سفارش دهید | دانلود رایگان |
Adhesion of nanoscale contacts is important in many applications, including microelectromechanical systems, fibrillar adhesives, and atomic force microscopy (AFM). Here, we quantify the properties of the adhesive traction-separation relation between ultrananocrystalline diamond (UNCD) AFM tips and polymethyl methacrylate (PMMA) surfaces using a novel AFM-based method that combines pull-off force measurements and characterization of the 3D geometry of the AFM tip. Three AFM tips with different nanoscale geometries were characterized and used to perform pull-off force measurements. Using the pull-off force data, the measured 3D tip geometries, and an assumed form of the traction-separation relation, specifically the Dugdale or 3-9 Lennard-Jones relations, the range, strength, and work of adhesion of the UNCD-PMMA contact were determined. The assumptions in the analyses were validated via finite element modeling. Both forms of the traction-separation laws result in a work of adhesion of approximately 50 mJ/m2 and the peak adhesive stress in the Lennard Jones relation is found to be about 50% higher than that obtained for the Dugdale law.
Journal: Extreme Mechanics Letters - Volume 9, Part 1, December 2016, Pages 119-126