In situ analysis of the crystallization process of Sb2S3 thin films by Raman scattering and X-ray diffraction

In situ analysis of the crystallization process of Sb2S3 thin films by Raman scattering and X-ray diffraction

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials & Design - Volume 121, 5 May 2017, Pages 1-10

Romain Parize, Thomas Cossuet, Odette Chaix-Pluchery, Hervé Roussel, Estelle Appert, Vincent Consonni,