کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5024915 | 1470577 | 2017 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Nonlinear refraction in (5,10,15,20-tetraphenylporphyrinato)-copper(II) doped PMMA thin film at wavelength 1064Â nm
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Nonlinear refraction in (5,10,15,20-tetraphenylporphyrinato)-copper(II) doped PMMA thin film at wavelength 1064Â nm Nonlinear refraction in (5,10,15,20-tetraphenylporphyrinato)-copper(II) doped PMMA thin film at wavelength 1064Â nm](/preview/png/5024915.png)
چکیده انگلیسی
(5,10,15,20-Tetraphenylporphyrinato)-copper(II) (TPP-Cu) are synthesized, and characterized by X-ray single crystal diffraction. TPP-Cu doped polymethylmethacrylate (PMMA) thin film on quartz substrate were prepared by spin-coating method. The morphology of the film were investigated by scanning electron microscopy. The nonlinear refractive properties of the film were studied using closed aperture Z-scan technique by picosecond (PS) laser pulses at different irradiance at wavelength 1064Â nm. The nonlinear refraction coefficient n2I value of the film were determined to be 1.28Â ÃÂ 10â12Â m2/W, this making them ideally suited to the applications in the field of all-optical switches.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optik - International Journal for Light and Electron Optics - Volume 150, December 2017, Pages 71-75
Journal: Optik - International Journal for Light and Electron Optics - Volume 150, December 2017, Pages 71-75
نویسندگان
Tingbin Li, Yali Hu,