Single event effect testing and radiation-hardened designing of several commercial optical transceivers

Single event effect susceptibility of several commercial transceivers are studied. In our testing, the receiver of the OLT transceiver and 12-channel receiver was tested for SEU only, and no latch-up and interrupt were observed during the exposure. However, the ONU transceiver, the 12-channel transmitter and the mini-optical transceiver module were tested for SEU, SEFI and the SEL. Based on results, we conclude that commercial components need to reinforce in order to be suitable for space application and discussed several radiation-hardened designing methods of optical transceivers.