کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5025879 1470595 2017 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Original research articleDevelopment of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens
ترجمه فارسی عنوان
مقاله پژوهشی اصلی توسعه الگوریتم برای ترسیم نقایص کامپیوتری طیف بازتابی تداخل برای نمونه های نازک فیلم
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی (عمومی)
چکیده انگلیسی

An algorithm is proposed for computer drawing accurate envelopes of reflectance spectra R(λ), for specimens representing a thin transmitting film on a substrate. The algorithm uses only one-step smoothing the spectrum, and piecewise cubic Hermite polynomial interpolation, which is shown to be superior to cubic spline interpolation for constructing envelopes of such R(λ) spectra. Boundary points are formulated and included at both ends of each of the two envelopes of the R(λ) spectrum. The boundary point at the longest wavelength accounts for the substrate absorption, which is notable e.g. for glass substrates at λ > 2000 nm. The boundary point at the shortest wavelength represents the convergence point for the two converging there envelopes. The performance of the algorithm is shown by comparing the true and the computer drawn envelopes for a model specimen, representing one relatively thin film, and two times thicker film, respectively, on a glass substrate. Examples are given for computer drawing envelopes of experimental spectra of two a-Si films, with disparate thicknesses, on different kind of glass substrates.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optik - International Journal for Light and Electron Optics - Volume 132, March 2017, Pages 320-328
نویسندگان
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