کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5128561 1489599 2017 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Bayesian model for subpixel uncertainty determination in optical measurements
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی صنعتی و تولید
پیش نمایش صفحه اول مقاله
Bayesian model for subpixel uncertainty determination in optical measurements
چکیده انگلیسی

Uncertainty determination can be obtained by two procedures: GUM and the Monte Carlo Method. This work presents a model that helps to evaluate the uncertainty in measurements collected by optical measuring machines when using the Monte Carlo method. Initially, the model converts intensity, using Bayesian probability, from the pixel image derived from camera into a polygonal area with three to five vertexes. The outer vertexes are fitted using least squares procedures to obtain a measurand shape approximation in a subpixel range. Algorithms have been programmed and verified into Matlab using synthetic images with different triangles. Through a detailed analysis, the usefulness of a new tool, the parameter, will be demonstrated as an alternative method for estimating uncertainty of measurements of pixel images.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Procedia Manufacturing - Volume 13, 2017, Pages 442-449
نویسندگان
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