Bias stress effect in solution-processed organic thin-film transistors: Evidence of field-induced emission from interfacial ions

Bias stress effect in solution-processed organic thin-film transistors: Evidence of field-induced emission from interfacial ions

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Organic Electronics - Volume 51, December 2017, Pages 128-136

Subhash Singh, Y.N. Mohapatra,