Structural stability of naphthyl end-capped oligothiophenes in organic field-effect transistors measured by grazing-incidence X-ray diffraction in operando

Structural stability of naphthyl end-capped oligothiophenes in organic field-effect transistors measured by grazing-incidence X-ray diffraction in operando

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Organic Electronics - Volume 49, October 2017, Pages 375-381

Mathias K. Huss-Hansen, Andreas E. Lauritzen, Oier Bikondoa, Mika Torkkeli, Luciana Tavares, Matti Knaapila, Jakob Kjelstrup-Hansen,