Time-resolved kelvin probe force microscopy to study population and depopulation of traps in electron or hole majority organic semiconductors

Time-resolved kelvin probe force microscopy to study population and depopulation of traps in electron or hole majority organic semiconductors

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Organic Electronics - Volume 41, February 2017, Pages 26-32

Jason P. Moscatello, Chloe V. Castaneda, Alyina Zaidi, Minxuan Cao, Ozlem Usluer, Alejandro L. Briseno, Katherine E. Aidala,