کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
533123 870061 2016 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A non-parametric approach to extending generic binary classifiers for multi-classification
ترجمه فارسی عنوان
یک رویکرد غیر پارامتری برای گسترش طبقه بندی های دوتایی عمومی برای چند طبقه بندی
کلمات کلیدی
چند طبقه بندی روش گروهی، یک به یک، فضای متعارف، برآورد تراکم غیر پارامتری
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر چشم انداز کامپیوتر و تشخیص الگو
چکیده انگلیسی


• Ensemble methods combine binary classifiers to yield a multi-classification output.
• One-vs-one ensemble: binary classifiers trained to discriminate each class pair.
• We propose a robust non-parametric probabilistic one-vs-one ensemble method: KDEMRP.
• KDEMRP improves classification performance over state-of-the-art (DCS, DRCW).
• KDEMRP improvements are statistically significant.

Ensemble methods, which combine generic binary classifier scores to generate a multi-classification output, are commonly used in state-of-the-art computer vision and pattern recognition systems that rely on multi-classification. In particular, we consider the one-vs-one decomposition of the multi-class problem, where binary classifier models are trained to discriminate every class pair. We describe a robust multi-classification pipeline, which at a high level involves projecting binary classifier scores into compact orthogonal subspaces, followed by a non-linear probabilistic multi-classification step, using Kernel Density Estimation (KDE). We compare our approach against state-of-the-art ensemble methods (DCS, DRCW) on 16 multi-class datasets. We also compare against the most commonly used ensemble methods (VOTE, NEST) on 6 real-world computer vision datasets. Finally, we measure the statistical significance of our approach using non-parametric tests. Experimental results show that our approach gives a statistically significant improvement in multi-classification performance over state-of-the-art.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Pattern Recognition - Volume 58, October 2016, Pages 149–158
نویسندگان
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