Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate

Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 419, 15 October 2017, Pages 595-602

M. Gabás, E. Ochoa-Martínez, E. Navarrete-Astorga, A.R. Landa-Cánovas, P. Herrero, F. Agulló-Rueda, S. Palanco, J.J. Martínez-Serrano, J.R. Ramos-Barrado,