Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials

Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 421, Part B, 1 November 2017, Pages 435-439

S. Funke, U. Wurstbauer, B. Miller, A. Matković, A. Green, A. Diebold, C. Röling, P.H. Thiesen,