Optical properties of thickness-controlled MoS2 thin films studied by spectroscopic ellipsometry

Optical properties of thickness-controlled MoS2 thin films studied by spectroscopic ellipsometry

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 421, Part B, 1 November 2017, Pages 884-890

Dahai Li, Xiongfei Song, Jiping Xu, Ziyi Wang, Rongjun Zhang, Peng Zhou, Hao Zhang, Renzhong Huang, Songyou Wang, Yuxiang Zheng, David Wei Zhang, Liangyao Chen,