Sn-loss effect in a Sn-implanted a-SiO2 host-matrix after thermal annealing: A combined XPS, PL, and DFT study

Sn-loss effect in a Sn-implanted a-SiO2 host-matrix after thermal annealing: A combined XPS, PL, and DFT study

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 367, 30 March 2016, Pages 320-326

D.A. Zatsepin, A.F. Zatsepin, D.W. Boukhvalov, E.Z. Kurmaev, N.V. Gavrilov,