کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5348425 | 1388079 | 2015 | 16 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Organic and organic-inorganic hybrid polymer thin films deposited by PECVD using TEOS and cyclohexene for ULSI interlayer-dielectric application
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Organic and organic-inorganic hybrid polymer thin films were deposited on Si(1Â 0Â 0) substrates at various ratios of TEOS (tetraethoxysilane) to cyclohexene by the plasma enhanced chemical vapor deposition (PECVD) method. The as-grown polymerized thin films were first analyzed by FT-IR and XPS. The results of FT-IR showed that the hybrid polymer thin films were polymerized with each fragmented precursor. The XPS results showed the chemical species and binding energies of each species. The Si 2p core-level spectra from the hybrid polymer thin film showed the status of the Si oxidation number. Impedance analysis was utilized for the measurement of the capacitance values and I-V curves, and an ultra low-k value and leakage current density of 1.75 and 10â9Â A/cm2 at 1Â MV/cm were obtained, respectively.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 354, Part A, 1 November 2015, Pages 134-138
Journal: Applied Surface Science - Volume 354, Part A, 1 November 2015, Pages 134-138
نویسندگان
Hyeon Jin Seo, Sang-Hun Nam, Sungsoo Kim, Jin-Hyo Boo,