کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5349100 | 1388095 | 2015 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Topotactic changes on η-Mo4O11 caused by biased atomic force microscope tip and cw-laser
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Topotactic changes on η-Mo4O11 caused by biased atomic force microscope tip and cw-laser Topotactic changes on η-Mo4O11 caused by biased atomic force microscope tip and cw-laser](/preview/png/5349100.png)
چکیده انگلیسی
We present topotactic changes on Mo4O11 crystals induced by a biased atomic force microscope tip and continuous laser. The transformation does not change the topography of the samples, while the surface potential shows remarkable changes on areas where the biased AFM tip was applied. No structural changes were observed by Raman spectroscopy, but AFM scans revealed changes to surface potential due to laser illumination. The observed phenomenon could be potentially useful for memristive memory devices considering the fact that properties of other molybdenum oxides vary from metallic to insulators.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 354, Part B, 1 November 2015, Pages 256-259
Journal: Applied Surface Science - Volume 354, Part B, 1 November 2015, Pages 256-259
نویسندگان
Miloš Borovšak, Petra Šutar, Evgeny Goreshnik, Dragan Mihailovic,