TSEM-based contour analysis as a tool for the quantification of the profile roughness of silica shells on polystyrene core particles

TSEM-based contour analysis as a tool for the quantification of the profile roughness of silica shells on polystyrene core particles

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 426, 31 December 2017, Pages 446-455

Dominik Sarma, Johannes Mielke, Mario Sahre, Uwe Beck, Vasile-Dan Hodoroaba, Knut Rurack,