کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5350552 1503660 2014 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
AFM image artifacts
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
AFM image artifacts
چکیده انگلیسی
Atomic force microscopy (AFM) has become an important tool in surface science and nanotechnology. It is obvious that the intrinsic limitations of AFM must be understood in order to get useful information about surface structure of the material under study. The ability to recognize artifacts should assist in reliable evaluation of instrument operation and in reporting of data. In this paper, we discuss the most frequently encountered image artifacts in atomic force microscopy. A variety of artifacts are illustrated by the results obtained with the aid of contact AFM (C-AFM), which can help avoid misinterpretations. It is shown that, despite inaccuracies in AFM image generation, in many cases valuable information can be obtained.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 304, 15 June 2014, Pages 11-19
نویسندگان
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