Use of XPS to clarify the Hall coefficient sign variation in thin niobium layers buried in silicon

Use of XPS to clarify the Hall coefficient sign variation in thin niobium layers buried in silicon

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 399, 31 March 2017, Pages 32-40

Iraida N. Demchenko, Wojciech Lisowski, Yevgen Syryanyy, Yevgen Melikhov, Iryna Zaytseva, Pavlo Konstantynov, Maryna Chernyshova, Marta Z. Cieplak,