کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5351529 | 1503671 | 2014 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Preparation, characterization and performance of Ti1âxAlxN/Ag/Ti1âxAlxN low-emissivity films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Preparation, characterization and performance of Ti1âxAlxN/Ag/Ti1âxAlxN low-emissivity films Preparation, characterization and performance of Ti1âxAlxN/Ag/Ti1âxAlxN low-emissivity films](/preview/png/5351529.png)
چکیده انگلیسی
In this paper, Ti1âxAlxN/Ag/Ti1âxAlxN sandwich structure low-emissivity (Low-E) films were prepared by radio frequency reactive magnetron sputtering (RF-MS) on glass substrates. The morphology, chemical state and performance of the film system were characterized by FIB-SEM, XPS, FT-IR, UV-vis spectrophotometer and electrochemical workstation. The results showed that the multilayer films exhibit an excellent visible light transmittance (T% > 85% at λ = 550 nm) and remarkable high infrared reflectivity (R% > 96% in the 2.5 â¼Â 25 μm range). The Ti1âxAlxN dielectric-layer could not only increase transmittance in the visible light range of Ag film based on an anti-reflection effect, but also modify the intrinsic color of Ag film from sapphire to total color neutrality. In addition, Ti1âxAlxN layer could enhance the chemical stability of the Ag film. In principle, the approach to obtain Ti1âxAlxN/Ag/Ti1âxAlxN sandwich structure in our work could provide an alternative way to fabricate outstanding Low-E films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 293, 28 February 2014, Pages 259-264
Journal: Applied Surface Science - Volume 293, 28 February 2014, Pages 259-264
نویسندگان
Jiamu Huang, Chengjie Xiang, Shaohui Li, Xiaoli Zhao, Guoqing He,