Angle resolved XPS for selective characterization of internal and external surface of porous silicon

Angle resolved XPS for selective characterization of internal and external surface of porous silicon

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 406, 1 June 2017, Pages 144-149

Anna Lion, Nadhira Laidani, Paolo Bettotti, Chiara Piotto, Giancarlo Pepponi, Mario Barozzi, Marina Scarpa,