کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5352489 | 1503566 | 2017 | 38 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Raman and XPS characterization of vanadium oxide thin films with temperature
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Raman and XPS characterization of vanadium oxide thin films with temperature Raman and XPS characterization of vanadium oxide thin films with temperature](/preview/png/5352489.png)
چکیده انگلیسی
The oxidation mechanisms and the numerous phase transitions undergone by VO2 thin films deposited on SiO2/Si and Al2O3 substrates when heated from room temperature (R.T.) up to 550 °C in air are investigated by Raman and X-ray photoelectron spectroscopy. The results show that the films undergo several intermediate phase transitions between the initial VO2 monoclinic phase at R.T. and the final V2O5 phase at 550 °C. The information about these intermediate phase transitions is scarce and their identification is important since they are often found during the synthesis of vanadium dioxide films. Significant changes in the film conductivity have also been observed to occur associated to the phase transitions. In this work, current and resistance measurements performed on the surface of the films are implemented in parallel with the Raman measurements to correlate the different phases with the conductivity of the films. A model to explain the oxidation mechanisms and phenomena occurring during the oxidation of the films is proposed. Peak frequencies, full-width half-maxima, binding energies and oxidation states from the Raman and X-ray photoelectron spectroscopy experiments are reported and analyzed for all the phases encountered in VO2 films prepared on SiO2/Si and Al2O3 substrates.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 403, 1 May 2017, Pages 717-727
Journal: Applied Surface Science - Volume 403, 1 May 2017, Pages 717-727
نویسندگان
Ferran Ureña-Begara, Aurelian Crunteanu, Jean-Pierre Raskin,