کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5354409 | 1503610 | 2015 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Study on WSb3Te material for phase-change memory applications
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The phase-change performance of WxSb3Te material were systemically investigated by in situ resistance-temperature measurement, X-ray diffraction (XRD), Raman scattering, adhesive strength test and transmission electron microscope (TEM) in this paper. Experimental results show that the thermal stability of Sb3Te was increased significantly with W doping. XRD and TEM results prove that the incorporation of W plays a role in suppressing the crystallization of Sb3Te films, causing smaller grain size. Furthermore, the adhesive strength between W electrode and phase-change material was increased obviously by W addition and a relatively rapid SET/RESET operation of 10Â ns is realized with large sensing margin.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 355, 15 November 2015, Pages 667-671
Journal: Applied Surface Science - Volume 355, 15 November 2015, Pages 667-671
نویسندگان
Yun Meng, Xilin Zhou, Peigao Han, Zhitang Song, Liangcai Wu, Chengqiu Zhu, Wenjing Guo, Ling Xu, Zhongyuan Ma, Lianke Song,