کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5354492 1503690 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Investigation of performance degradation in metallized film capacitors
ترجمه فارسی عنوان
بررسی تخریب عملکرد در خازن های فیلم فلزی
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
چکیده انگلیسی

Zn-Al metallized film capacitors in two different production stages were investigated to explain the decrease of capacitors performance with time. Unsealed and sealed capacitors with different aluminium content in metallization layer were investigated. Scanning electron microscopy (SEM) was used to image the surface of the metallization layers, energy dispersive X-ray spectroscopy (EDS) was used to determine the chemical composition and Auger electron spectroscopy (AES) was used to determine the chemical composition of the top of the metallization layers as well as to estimate the degree of oxidation. It was found that air humidity degraded the metallization layer of unsealed capacitors, especially at lower Al contents. Sealed capacitors were exposed to high electric fields, typical for standard usage. It was found - rather unexpectedly - that the performance was decreased by increasing Al content. A crystallographic explanation was proposed.

► Capacitors that perform differently differ in surface morphologies of metalized foils. ► Hexagonal ZnO monocrystallites were discovered on the surfaces of the poorly performing capacitors. ► AES was used to distinguish oxide/metallic state of Zn and Al. ► On the surface, Zn corresponds to ZnO, deeper, to metallic Zn; Al corresponds to oxidized Al throughout. ► Corrosion resistivity in air is increased by increasing Al concentration up to 5 wt.%.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 273, 15 May 2013, Pages 465-471
نویسندگان
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