Fractal features of CdTe thin films grown by RF magnetron sputtering

- CdTe thin films were deposited on glass substrates by RF magnetron sputtering at room temperature with different deposition time 5, 10 and 15 min.
- Nanostructure of CdTe layer indicates that CdTe films are polycrystalline and have zinc blende structure, irrespective of their deposition time.
- Complexity and roughness of the CdTe films and strength of multifractality increase with increasing deposition time.
- Detrended fluctuation analysis (DFA) and also multifractal detrended fluctuation analysis (MFDFA) methods showed that prepared CdTe films have multifractal nature.