کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5358202 | 1388229 | 2010 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectroscopic ellipsometry study of the dielectric response of Au-In and Ag-Sn thin-film couples
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Spectroscopic ellipsometry study of the dielectric response of Au-In and Ag-Sn thin-film couples Spectroscopic ellipsometry study of the dielectric response of Au-In and Ag-Sn thin-film couples](/preview/png/5358202.png)
چکیده انگلیسی
Optical properties and phase composition of In-Au and Sn-Ag ultra-thin films grown by sequential evaporating and co-depositing of metals in a vacuum were investigated combining X-ray diffraction and spectroscopic ellipsometry methods. The atomic concentration ratios of bilayer and co-deposited samples were the same, i.e. In(Sn):Au(Ag) = 1:2. The XRD patterns indicated creation of AuIn, AuIn2, Au3In2, Au9In4 and Ag3Sn intermetallic compounds at room temperature. The effective complex dielectric functions of the composite layers, ãεË(E)ã=ãε1(E)ã+iãε2(E)ã, were determined from ellipsometric quantities Ψ and Î measured in a photon energy range of 0.6-6.5 eV. The free-carrier parameters (unscreened plasma frequency and free-carrier damping) and optical resistivity were evaluated using a semiclassical Drude-Lorentz model of the effective dielectric function. There was noticed a distinct influence of phase composition and surface morphology on the optical constants and conductivity of the samples: Ïop changed from approximately 15 μΩ cm to 37 μΩ cm for Ag-Sn structures, composed of β-Sn and Ag3Sn phases, and from 21 μΩ cm to 83 μΩ cm for Au-In multiphase system. Lower resistivity demonstrated diffusive layers formed after deposition of an In(Sn) thin film on the noble metal underlayer.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 256, Issue 15, 15 May 2010, Pages 4839-4844
Journal: Applied Surface Science - Volume 256, Issue 15, 15 May 2010, Pages 4839-4844
نویسندگان
A.A. Wronkowska, A. Wronkowski, K. KukliÅski, M. Senski, Å. SkowroÅski,