Enhanced dielectric and ferroelectric properties of Pb1−3x/2Lax(Zr0.5Ti0.5)O3 thin films with low lanthanum substitution

▶ Large dielectric constants of the films are obtained within range of 800-1600 which are almost comparable to those observed in bulk ceramics. ▶ Low lanthanum substitution contributes to higher electric properties of the films due to the improvement of non-180° domain wall mobility as well as the stabilization of tetragonal phase.