کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5361634 | 1388275 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectroscopic studies of (AsSe)100âxAgx thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Thin (AsSe)100âxAgx films have been grown onto quartz substrates by vacuum thermal evaporation or pulsed laser deposition from the corresponding bulk materials. The amorphous character of the coatings was confirmed by X-ray diffraction investigations. Their transmission was measured within the wavelength range 400-2500Â nm and the obtained spectra were analyzed by the Swanepoel method to derive the optical band gap Eg and the refractive index n. We found that both parameters are strongly influenced by the addition of silver to the glassy matrix: Eg decreases while n increases with Ag content. These variations are discussed in terms of the changes in the atomic and electronic structure of the materials as a result of silver incorporation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 255, Issue 24, 30 September 2009, Pages 9691-9694
Journal: Applied Surface Science - Volume 255, Issue 24, 30 September 2009, Pages 9691-9694
نویسندگان
V. Ilcheva, T. Petkova, P. Petkov, V. Boev, G. Socol, F. Sima, C. Ristoscu, C.N. Mihailescu, I.N. Mihailescu, C. Popov, J.P. Reithmaier,