The ferroelectric and ferromagnetic characterization of CoFe2O4/Pb(Mg1/3Nb2/3)O3-PbTiO3 multilayered thin films

► The multiferroic (PMN-PT/CFO)n (n = 1,2) multilayered thin films have been prepared on SiO2/Si(1 0 0) substrate with LNO as buffer layer via a rf magnetron sputtering method. ► The smooth, dense and crack-free surface shows the excellent crystal quality with root-mean-square (RMS) roughness only 2.9 nm, and average grain size of CFO thin films on the surface is about 43.88 nm. ► (l 0 0) orientation of the PMN-PT layers appear in the multilayered thin films, and the CFO layers in the multilayered thin films with period n = 1 show (4 0 0) and (3 1 1)-oriented. ► This multilayered thin films present ferromagnetic and ferroelectric properties, which become deteriorated with the increase of number n.