Elongation rate measurements of nanofilms by microbump method induced by laser pulse

► A new method aims to measure elongation rate of thin films with nano-level thickness. ► The method made use of a simple chemical reaction as follows: AgOx⟶160oCAg+x2O2. ► The parameters of the microbumps could be controlled by adjusting laser energy. ► Residual stress, Young's modulus, and Poisson's ratio, could be studied in next work.