کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5363515 | 1388303 | 2008 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry Molecular ion yield enhancement induced by gold deposition in static secondary ion mass spectrometry](/preview/png/5363515.png)
Static ToF-SIMS was used to evaluate the effect of gold condensation as a sample treatment prior to analysis. The experiments were carried out with a model molecular layer (Triacontane MÂ =Â 422.4Â Da), upon atomic (In+) and polyatomic (Bi3+) projectile bombardment. The results indicate that the effect of molecular ion yield improvement using gold metallization exists only under atomic projectile impact. While the quasi-molecular ion (M+Au)+ signal can become two orders of magnitude larger than that of the deprotonated molecular ion from the pristine sample under In+ bombardment, it barely reaches the initial intensity of (MâH)+ when Bi3+ projectiles are used. The differences observed for mono- and polyatomic primary ion bombardment might be explained by differences in near-surface energy deposition, which influences the sputtering and ionization processes.
Journal: Applied Surface Science - Volume 255, Issue 4, 15 December 2008, Pages 824-827