MCsn+ cluster formation on organic surfaces: A novel way to depth-profile organics?

Surprisingly, some of those MCs2+ clusters were still detected even after a very long sputtering fluence (above 1017 ions/cm2), proving that some molecular depth profiling is also possible in this “Cs2-cationisation” mode. In other words, this work could open the way to an extension of the MCsn+ cluster analysis, commonly used in inorganic depth profiling, to the in-depth molecular analysis of organic layers.