کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5364103 1388311 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The interface reaction of high-k La2Hf2O7/Si thin film grown by pulsed laser deposition
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
The interface reaction of high-k La2Hf2O7/Si thin film grown by pulsed laser deposition
چکیده انگلیسی

The La2Hf2O7 films have been deposited on Si (1 0 0) substrate by using pulsed laser deposition (PLD) method. X-ray diffraction (XRD) demonstrates that the as-grown film is amorphous and crystallizes after 1000 °C annealing. The interface structure is systematically studied by Synchrotron X-ray reflectivity (XRR), Fourier transform infrared (FTIR) and X-ray photoelectron spectroscopy (XPS). Silicide, silicate and SiOx formations from interfacial reaction are observed on the surface of the Si substrate in the as-grown film. The impact of silicide formation on the electrical properties is revealed by capacitance-voltage (C-V) measurements. By post-deposition annealing (PDA), silicide can be effectively eliminated and C-V property is obviously improved.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 256, Issue 3, 15 November 2009, Pages 838-841
نویسندگان
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