کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5364307 1388314 2007 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Imaging characterization of carbon nanotube tips modified using a focused ion beam
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Imaging characterization of carbon nanotube tips modified using a focused ion beam
چکیده انگلیسی

A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 253, Issue 16, 15 June 2007, Pages 6872-6877
نویسندگان
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