کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5364488 1388316 2009 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Image contrast enhancement in field-emission scanning electron microscopy of single-walled carbon nanotubes
چکیده انگلیسی

The image contrast enhancement in scanning electron microscopy of single-walled carbon nanotubes (SWNTs) on SiO2 surfaces was experimentally investigated using a field-emission scanning electron microscope (FESEM) using a wide range of primary electron (PE) voltages. SWNT images of different contrasts were obtained at different PE voltages. Image contrast enhancement of SWNTs was investigated by charging SiO2 surfaces at different PE voltages. The phenomena are ascribed to the surface potential difference and charge injection between SWNTs and SiO2 substrates induced by the electron-beam irradiation.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 255, Issue 7, 15 January 2009, Pages 4341-4346
نویسندگان
, , , , , ,