کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5364652 1388318 2008 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Pulsed electron beam deposition of highly oriented thin films of polytetrafluoroethylene
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Pulsed electron beam deposition of highly oriented thin films of polytetrafluoroethylene
چکیده انگلیسی

Thin films of polytetrafluoroethylene (PTFE) were deposited by pulsed electron deposition (PED) technique. The transmission electron microscopy (TEM) image of the RT fabricated (20 Å thick) film on carbon coated copper grid shows crystalline nature. Infrared spectra show one to one correspondence between PED ablated film and the PTFE bulk target. The asymmetrical and symmetrical -CF2- stretching modes were observed at 1220 and 1156 cm−1, respectively. The -CF2- wagging and bending modes occur at 644 and 512 cm−1, respectively. X-ray diffraction patterns of the film deposited at room temperature (RT) show oriented film along (1 0 0) plane of hexagonal structure and the crystalline nature is retained up to 300 °C on vacuum annealing. The room temperature fabricated film shows smooth and pin hole free surface whereas post-annealing brings discontinuity, roughness and pin holes.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 254, Issue 13, 30 April 2008, Pages 4063-4066
نویسندگان
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