کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5364800 | 1388320 | 2010 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Hydrogen peroxide treatment on ZnO substrates to investigate the characteristics of Pt and Pt oxide Schottky contacts
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We utilize hydrogen peroxide (H2O2) treatment on (0Â 0Â 0Â 1) ZnO substrates to investigate the characteristics of Pt and Pt oxide Schottky contacts (SCs). X-ray rocking curves show the mosaicity structure becomes larger after H2O2 treatment. Photoluminescence (PL) spectra show the yellow-orange emission peaking at â¼576-580Â nm with respect to deep level of oxygen interstitials introduced by H2O2 treatment. The threshold formation of ZnO2 resistive layer on H2O2-treated ZnO for 45Â min is observed from grazing-incidence X-ray diffraction. The better electrical characteristic is performed by Pt oxide SC with the larger barrier height (1.09Â eV) and the lower leakage current (9.52Â ÃÂ 10â11Â A/cm2 at â2Â V) than Pt SC on the H2O2-treated ZnO for 60Â min. X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometer (SIMS) examinations indicate the promoted interface oxide bonding and Zn outdiffusion for Pt oxide contact, different from Pt contact. Based on current-voltage, capacitance-voltage, X-ray diffraction, PL spectra, XPS, and SIMS results, the possible mechanism for effective rectifying characteristic and enhanced Schottky behavior is given.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 257, Issue 2, 1 November 2010, Pages 610-615
Journal: Applied Surface Science - Volume 257, Issue 2, 1 November 2010, Pages 610-615
نویسندگان
Chia-Hung Tsai, Chen-I Hung, Cheng-Fu Yang, Mau-Phon Houng,