کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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5364801 | 1388320 | 2010 | 6 صفحه PDF | دانلود رایگان |
In this paper we study nanocrystalline zinc oxide thin films produced by oxidation of electrodeposited zinc nanolayers on a monocrystalline p-Si(1 1 1) substrate.The electrolyte used is ZnCl2, an aqueous solution of 4 Ã 10â2 mol/l concentration. Several deposits were made for various current densities, ranging from 13 mA/cm2 to 44 mA/cm2, flowing through the solution at room temperature. A parametric study enabled us to assess the effect of the current density on nucleation potential and time as well as zinc films structure. The grazing incidence X-ray diffraction (GIXD) revealed that both Zn and ZnO films are polycrystalline and nanometric. After 1-h oxidation of zinc films at 450 °C in the open air, the structural analyses showed that the obtained ZnO films remained polycrystalline with an average crystal size of about 47 nm and with (1 0 0), (0 0 2) and (1 0 1) as preferential crystallographic orientations.
Journal: Applied Surface Science - Volume 257, Issue 2, 1 November 2010, Pages 616-621