RETRACTED: Spectral diffuse reflectance measurements of gadolinia, silica thin film systems using synchrotron radiation

This article has been retracted at the request of the Editor-in-Chief and Author. The article is a duplicate of a paper that has already been published in Applied Physics D, 39 (2006), 4059-4067, doi:10.1088/0022-3727/39/18/017. One of the conditions of submission of a paper for publication is that authors declare explicitly that the paper is not under consideration for publication elsewhere. As such this article represents a severe abuse of the scientific publishing system. The scientific community takes a very strong view on this matter and apologies are offered to readers of the journal that this was not detected during the submission process.