کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5366903 1388357 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Quantitative measurement of image intensity in transmission electron microscope images
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Quantitative measurement of image intensity in transmission electron microscope images
چکیده انگلیسی

We have made a thorough comparison of the ability of image simulations to predict the contrast in high-resolution electron microscope lattice images of GaAs. Simulations of the diffracted beam intensities from thickness fringes generally agreed with observations to within ∼20% over a range of GaAs thicknesses up to 150 nm. Likewise, simulations of lattice images agreed qualitatively with experimental lattice images over a range of defocus and sample thicknesses up to 20 nm. However, using the same parameters as for the diffracted beam intensities, lattice fringe amplitudes were calculated to be typically two to three times higher than observed experimentally.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 11, 31 March 2006, Pages 3984-3988
نویسندگان
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