کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5366903 | 1388357 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Quantitative measurement of image intensity in transmission electron microscope images
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
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چکیده انگلیسی
We have made a thorough comparison of the ability of image simulations to predict the contrast in high-resolution electron microscope lattice images of GaAs. Simulations of the diffracted beam intensities from thickness fringes generally agreed with observations to within â¼20% over a range of GaAs thicknesses up to 150Â nm. Likewise, simulations of lattice images agreed qualitatively with experimental lattice images over a range of defocus and sample thicknesses up to 20Â nm. However, using the same parameters as for the diffracted beam intensities, lattice fringe amplitudes were calculated to be typically two to three times higher than observed experimentally.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 11, 31 March 2006, Pages 3984-3988
Journal: Applied Surface Science - Volume 252, Issue 11, 31 March 2006, Pages 3984-3988
نویسندگان
Wenbang Qu, Chris Boothroyd, Alfred Huan,