کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5367183 1388362 2006 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Influence of buffer layer thickness on the structure and optical properties of ZnO thin films
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Influence of buffer layer thickness on the structure and optical properties of ZnO thin films
چکیده انگلیسی

A series of ZnO thin films were deposited on ZnO buffer layers by DC reactive magnetron sputtering. The buffer layer thickness determination of microstructure and optical properties of ZnO films was investigated by X-ray diffraction (XRD), photoluminescence (PL), optical transmittance and absorption measurements. XRD results revealed that the stress of ZnO thin films varied with the buffer layer thickness. With the increase of buffer layer thickness, the band gap edge shifted toward longer wavelength. The near-band-edge (NBE) emission intensity of ZnO films deposited on ZnO buffer layer also varied with the increase of thickness due to the spatial confinement increasing the Coulomb interaction between electrons and holes. The PL measurement showed that the optimum thickness of the ZnO buffer layer was around 12 nm.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 8, 15 February 2006, Pages 2888-2893
نویسندگان
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