کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5367244 | 1388363 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7âδ thin film by the low-temperature scanning microwave microscope
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We developed a scanning microwave microscope (SμM) designed for high-throughput electric-property screening as well as for rapid construction of electronic phase diagrams at low temperatures. As a sensor probe, we used a high-Q λ/4 coaxial cavity resonator to which a thin needle with ball-tip end was attached. The sensor module was mounted on the low-temperature XYZ stage, which allowed us to map out the change of resonance frequency and quality factor due to the local tip-sample interaction at low temperatures. From the measurements of combinatorial thin films, such as Ti1âxCoxO2âδ and Nd0.9Ca0.1Ba2Cu3O7âδ (NCBCO), it was demonstrated that this SμM system has enough performance for the high-throughput characterization of sample conductance under variable temperature conditions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 7, 31 January 2006, Pages 2615-2621
Journal: Applied Surface Science - Volume 252, Issue 7, 31 January 2006, Pages 2615-2621
نویسندگان
Sohei Okazaki, Noriaki Okazaki, Xiaoru Zhao, Hidetaka Sugaya, Sei-ichiro Yaginuma, Ryota Takahashi, Makoto Murakami, Yuji Matsumoto, Toyohiro Chikyow, Hideomi Koinuma, Tetsuya Hasegawa,