کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5367429 1388365 2011 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study of deposition patterns of plating layers in SiC/Cu composites by electro-brush plating
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Study of deposition patterns of plating layers in SiC/Cu composites by electro-brush plating
چکیده انگلیسی

SiC reinforced copper composite coatings were prepared by electro-brush plating with micron-size silicon carbide (SiC) ranging from 1 to 5 μm on pure copper sheet in this paper. The micro-structural characterizations of SiC/Cu composite coatings were performed by optical microscope and Scanning Electron Microscope (SEM) coupled with spectrometer, to study co-deposition mechanism of SiC/Cu. It was found that there were three different patterns of SiC deposition in plating layers during electro-brush plating process, i.e. the particles could deposit inside copper grains, in grain boundaries, or in holes of the surface. To investigate deposition mechanism of each pattern, size of SiC and copper grains was compared. By comparison of size of copper grains and hard particles, SiC were either wrapped in copper grains or deposited in grain boundaries. Moreover, electro-brush plating layers at different brush velocities and current densities were obtained respectively, to analyze the microstructure evolution of the composite coatings. The hardness of plating layers was measured. The results indicated at the current density of 3 A/dm2, the SiC/Cu coating was compact with SiC content at a high level and the hardness reached a maximum.

► We found three different patterns of SiC deposition in copper plating layers during electro-brush plating. ► Deposition patterns depend on comparison of size of copper grains and hard particles. ► Hardness of SiC/Cu coatings reaches a maximum at the current density of 3 A/dm2.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 257, Issue 23, 15 September 2011, Pages 10294-10299
نویسندگان
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