کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5367436 1388366 2007 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of In/Pd and Pd/In/Pd thin films by ellipsometric, XRD and AES methods
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Characterization of In/Pd and Pd/In/Pd thin films by ellipsometric, XRD and AES methods
چکیده انگلیسی
In/Pd and Pd/In/Pd thin films were prepared by thermal evaporation on the SiO2 substrate in a vacuum. The structural and optical properties of the films were investigated by means of X-ray diffractometry (XRD), Auger electron spectroscopy (AES) and spectroscopic ellipsometry (SE). Auger depth profile studies were performed in order to determine the composition of elements in the Pd-In systems. Interdiffusion of metals was detected at room temperature. Optical properties of Pd-In composite layers formed due to the interdiffusion were derived from ellipsometric quantities Ψ and Δ measured in the photon energy range 0.75-6.50 eV at different angles of incidence. The effective optical spectra show absorption peaks dependent on the composition of nonuniform films. The XRD patterns indicated formation of Pd1−xInx intermetallic phases in the samples.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 253, Issue 7, 30 January 2007, Pages 3367-3371
نویسندگان
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