کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5367977 | 1388380 | 2007 | 6 صفحه PDF | دانلود رایگان |

Vanadium oxide thin films were prepared by sol-gel method, then subjected to Nd:YAG laser (CW, 1064Â nm) radiation. The characteristics of the films were changed by varying the intensity of the laser radiation. The nanocrystalline films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM) and scanning electron microscopy (SEM). XRD revealed that above 102Â W/cm2 the original xerogel structure disappears and above 129Â W/cm2 the films become totally polycrystalline with an orthorhombic structure. From TEM observations, we can see that due to laser radiation, the originally fibrillar-like particles disappear and irregular shaped, layer structured V2O5 particles are created. From XPS spectra we can conclude that due to laser radiation the O/V ratio increased with higher intensities.
Journal: Applied Surface Science - Volume 254, Issue 5, 30 December 2007, Pages 1363-1368