کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5368254 | 1388388 | 2010 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: A new methodology for the near-surface strain measurement on Pd-Ag-Sn alloy A new methodology for the near-surface strain measurement on Pd-Ag-Sn alloy](/preview/png/5368254.png)
With the development of modern synchrotron sources, high-energy X-ray diffraction plays an important role in the residual stresses analysis of materials. This paper deals with the development of a new high-energy synchrotron X-ray diffraction (HESXRD) stress evaluation method for improving the near-surface strain measurement. For this purpose a new Monte Carlo simulation program has been developed to modelize any synchrotron radiation instrument. Futhermore conventional X-ray diffraction measurements have also been carried out after chemical etching, to define the surface and in-depth stresses of the sample, thus giving a reference to test the synchrotron radiation measurements. It has been shown that the reliability of this method is better than 5 μm. This method has been applied to a machined palladium alloy (Pd-Ag-Sn) plate substrate.
Journal: Applied Surface Science - Volume 256, Issue 21, 15 August 2010, Pages 6340-6344