کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5368580 1388400 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films
چکیده انگلیسی

Metal-organic chemical vapor deposition (MOCVD) made layers of strontium-bismuth-tantalate (SBT) were characterized by spectroscopic ellipsometry (SE) using the Adachi model [S. Adachi, Phys. Rev. B 35 (1987) 7454-7463]. The evaluated optical parameters were correlated with the physical and chemical behavior examined by X-ray diffraction (XRD).As a result, it was possible to fit the measured spectra with the Adachi model in a wide range covering the region of the band gap. The Adachi model provides electronic layer parameters like the transition energy E0 and broadening Γ. Our investigations established a correlation between XRD-determined average grain size and the electronic layer parameters.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 253, Issue 1, 31 October 2006, Pages 349-353
نویسندگان
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