کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5368846 1388410 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
3D-TOFSIMS characterization of black spots in polymer light emitting diodes
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
3D-TOFSIMS characterization of black spots in polymer light emitting diodes
چکیده انگلیسی

The occurrence and formation of black spots areas in PolyLED devices has been studied by time-of-flight SIMS (TOFSIMS). The composition, shape and position of the black spots is visualised by three-dimensional (3D)-TOFSIMS depth-profiling. It has been established that the formation of non-emissive spots is due to the growth of aluminium oxide clusters at the AlBa/polymer interface. Electron injection in the black spots is lost by the resulting local increase of the resistivity of the cathode.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 19, 30 July 2006, Pages 6597-6600
نویسندگان
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