کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5368847 1388410 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
G-SIMS-FPM: Molecular structure at surfaces-a combined positive and negative secondary ion study
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
G-SIMS-FPM: Molecular structure at surfaces-a combined positive and negative secondary ion study
چکیده انگلیسی

G-SIMS is an easy to use method that considerably simplifies complex static SIMS spectra. The G-SIMS peaks relate directly to the parent molecular structure and so provide a library independent method for direct interpretation and identification. For larger molecules (>100 u) the mass alone may be insufficient to identify the molecule unambiguously. A development of G-SIMS, G-SIMS-fragmentation pathway mapping (FPM), solves this problem. G-SIMS-FPM allows the molecular structure to be re-assembled by following fragmentation pathways as the G-SIMS surface plasma temperature is varied. In this study, we develop the inclusion of negative secondary ion fragmentation data to provide a more complete analysis. This approach is exampled with data for complex molecules of Irganox 1010 and folic acid.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 19, 30 July 2006, Pages 6601-6604
نویسندگان
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